Rooted in Requirement-Driven Insight
Delivered through Solution-Oriented Design
Semiconductor Equipment

Semiconductor Equipment Overview

Founded in 2008, Suzhou PTC Optical Instrument Co., Ltd delivers cutting-edge intelligent equipment and tailored technical solutions designed to elevate factory quality control capabilities.


PTC Semiconductor Equipment category offers a comprehensive portfolio of defect inspection solutions, meticulously engineered to meet the rigorous standards of the global semiconductor and electronics manufacturing industries.

Tailored Technology Integration

High-Precision Defect Inspection

Minimized Downtime Enhanced Production Throughput

Uncompromising Quality Control

Smart Factory Compatibility

  • Superior to heart
  • Professional quality
  • First-rate service

Composition of Semiconductor Equipment

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Smart Loading/ Unloading System

- Automated, high-throughput material transfer with minimal operator intervention

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Defect Inspection System


-Ultra-sensitive detection of micron defects to ensure zero-defect output

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Algorithmic Judgment System

-Intelligent algorithms that instantly distinguish real defects from nuisance patterns

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Statistical Data System


- Real-time statistical process control and actionable yield insights

Delivery Assurance


Complete in-house R&D and production of core components
Large cost reduction through streamlined supply chains
Much shorter lead time by eliminating external dependencies
100% quality control from raw materials to final assembly and debugging
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SA8000
ISO 45001
ISO 9001
ISO14001

Technical Strength

why choose PTC

Hot Solutions

Cosmetic Defect Inspection Equipment

Designed for cosmetic defect inspection on ceramic substrates — such as Al₂O₃, AlN, and Si₃N₄ — this semiconductor AOI system identifies a wide range of imperfections, including contamination, spots, chipping, protrusions, micro-cracks, holes, surface marks, and others.

Scanning Acoustic Tomography

Equipped with a core acoustic microscope and intelligent inspection algorithm, the multiple probes scan products immersed in water in parallel. It can clearly display the multi-layer structure on both the surface and interior of the product simultaneously, thereby compensating for the limitations of visual inspection, which cannot detect internal defects such as voids and micro-cracks.

High Voltage Testing Equipment

Designed for AC/DC high-voltage testing of ceramic and metallized substrates, this automated system checks withstand voltage performance and effectively rejects defective samples containing bubbles, holes, or other flaws — quickly identifying hidden microcracks through electrical testing.

FAQ

How do I choose the right semiconductor equipment for my needs?

We will provide expert consultation to identify the best solutions tailored to your detailed requirement, such as precision and cycle time. Meanwhile, our recommendation will take your budget control into consideration.

Can your semiconductor equipment be integrated with existing production lines?

Can your semiconductor equipment handle high-volume inspection and production?

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Contact Info

Telephone: +86-512-5792-5888
 Email: sales@ptcstress.com
 Address: No.581, Hengchangjing Road, Zhoushi Town, Kunshan City, Jiangsu Province, 215337, China

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